MX63/MX63L
The MX63 and MX63L microscope systems offer quality observations for up to 300 mm wafers, flat panel displays, printed circuit boards, and other large samples. These ergonomic and user-friendly systems feature a modular design, enabling optimal observation conditions in diverse applications. When combined with OLYMPUS Stream image analysis software, the inspection workflow is simplified and streamlined, from observation to report generation.


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