The latest generation technology that increases testing efficiencies, ensuring superior manual and advanced
AUT application performance with faster setups, test cycles, and reporting,to inspect small tube OD 0.84 inch
to large vessel to flat surface. Designed for NDT leaders, this high-end, scalable platform delivers true
next-generation NDT performance, high acquisition rate and new powerful software features for efficient
manual and automated inspection performance –all in a portable, modular instrument. The combination of
the OmniScan™ X3 flaw detector’s live total focusing method (TFM) envelope processing, up to 1,024 × 1,024
grid resolution, and vibrant color display make its TFM images stand out with exceptional detail. Defects
appear sharp and clear with high resolution.